Národní úložiště šedé literatury Nalezeno 2 záznamů.  Hledání trvalo 0.00 vteřin. 
Determination of device geometrical misalignments influence on dimensional measurements in X-ray microcomputed tomography
Blažek, Pavel ; Klapetek, Petr (oponent) ; Zikmund, Tomáš (vedoucí práce)
This thesis deals with geometrical misalignments of X-ray computed tomography (CT) device components. It focuses on their adverse effects on metrological CT measurements and on the methods which can be used to eliminate them. Results of simulations of CT measurements with misaligned detector and rotation stage are present, showing which misalignments plays the most significant role in the measurement. The practical part deals with HeliScan microCT, which implements a unique calibration algorithm to eliminate errors from misaligned CT geometry. New reference objects (plates with ruby spheres and calibrated zircon sphere) are developed for the CT system complying with the requirements of guideline VDI/VDE 2630 1.3. for metrological performance testing of CT devices. Testing objects suitable for a larger field of view were manufactured, calibrated, and successfully tested in CT measurement.
Determination of device geometrical misalignments influence on dimensional measurements in X-ray microcomputed tomography
Blažek, Pavel ; Klapetek, Petr (oponent) ; Zikmund, Tomáš (vedoucí práce)
This thesis deals with geometrical misalignments of X-ray computed tomography (CT) device components. It focuses on their adverse effects on metrological CT measurements and on the methods which can be used to eliminate them. Results of simulations of CT measurements with misaligned detector and rotation stage are present, showing which misalignments plays the most significant role in the measurement. The practical part deals with HeliScan microCT, which implements a unique calibration algorithm to eliminate errors from misaligned CT geometry. New reference objects (plates with ruby spheres and calibrated zircon sphere) are developed for the CT system complying with the requirements of guideline VDI/VDE 2630 1.3. for metrological performance testing of CT devices. Testing objects suitable for a larger field of view were manufactured, calibrated, and successfully tested in CT measurement.

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